Texas A&M University-Kingsville

EEEN 5333

Topics covered:

  • Lecture 1

    • Overview of VLSI design issues

  • Lecture 2

    • Electrical properties of MOS transistors

    • Depletion and enhancement mode

    • Threshold voltage

    • Simple MOSFET fabrication steps (MOSFET Fabraication)

  • Lecture 3

    • Transistor operation (MOSFET Operation)

    • Regions of operation

    • Trans. Char. equations, current equations

    • Body effect

  • Lecture 4

    • Pinch off region

    • Channel length modulation 

  • Lecture 5  (Homework Solutions Hw-2 ,  Hw-3Hw3b,  Hw-4)

    • Inverter Characteristics

    • Channel resistance

    • Gate capacitance, diffusion capacitance, routing capacitance

    • Gain ratio

  • Lecture 6

    • Noise margin

    • Latch up

  • Lecture 7

    • Switching Characteristic

      • Fall time

      • Rise time

    • Delays

      • Propagation delay

      • Empirical delay  model

      • Gate delay approximation

      • Body effect and delay

  • Lecture 8

    • CMOS process technology 

  • Lecture 9

    • CMOS process enhancements

  • Lecture 10

    • Deposition and Lithography

  • Lecture 11

    • Etching and Implantation

  • Lecture 12

    • Delay Analysis for basic gates

  • Lecture 13

  • Lecture 14

    • Performance estimation

    • Transistor sizing , Hw7B

  • Lecture 15

    • CMOS power dissipation

    • Transmission gates, Hw8AHw8B

  • Lecture 16

    • Wire model

    • Alternative design techniques (Pseudo nmos, CVSL,  etc.)

  • Lecture 17

    • Layout Design, DRC

  • Lecture 18

    • VLSI CAD tools

  • Lecture 19

    • Technology file set up 

    • Scalable layout design

    • Tapeout and file formats

  • Lecture 20 

    • Chip input/output circuits 

    • Pad and power connections

  • Lecture 21-22

    • Alternative CMOS gates (Dynamic gates, etc.)

    • (Homework Solutions Hw-10Hw-11)

  • Lecture 23

    • BiCMOS gate design

  • Lecture 24-25

    • Design of memory and other programmable devices

  • Lecture 26

    • Testing (observability, controllability, BIST)

    Assignments

This page was last updated on: November 19, 2012